UV照射装置:VUM-3500
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title 01
Charge removal and data erasure for flash memory, other non-volatile memory, image sensors, etc.

 

title 01
  • The 254nm wavelength is optimal for charge removal.
  • Single wavelength enables low-temperature processing.
  • Low incident angle UV light effectively irradiates the target area.
  • Improvement of LSI yield and reliability.
 
Product specification

Product specification

Model type VUM-3500
Wafer size Φ300 mm (standard)
No. of sheets processed at the same time 15 sheets
Cassette form FOUP
Wafer transfer Automatic transfer
Number of lamps 20 pcs.
Intensity Measurement Automatic measurement

 

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